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The Double Pulse Tester is the first universal testbed for power electronics device characterization. Design engineers, system engineers, and transistor manufacturers who need to characterize wide bandgap (WBG) devices, can cut development time and cost of multiple disposable testbeds and make device comparisons uniformly valid using the plug-and-play double pulse tester.

“The Universal Double Pulse Tester can help you save time in your characterization, help validate device comparisons, and fully support test and/or design consultation.”

Who Can Benefit from a Double Pulse Tester

WBG Transistor Design & Production

Characterize your latest developments and validate comparisons with competitors and your own previous generation. Enable detailed end-of-line manufacturing testing for quality control.

Power System Researchers

Observe WBG devices in fine details, and expand your perspective on systems, reliability, and component longevity.

Power Supply Developments

Smooth your transition to WBG designs, standardize your device selection process, and cut development cycles.

Key Features

  • Plug & Play: No need to redesign a testbed each time a new device is under consideration.
  • Universal: Use the testbed to test any GaN and SiC devices.
  • Custom: Customizable design and characterization.
  • Compatible: Can be used with common workbench equipment.

How it Works

The Double Pulse Tester is a standard method for measuring the switching parameters of power devices. Historically this has been a time-consuming process to set up. ADS offers two (2) easy-to-use double pulse testers; the Gallium Nitrade (GaN) and Silicon Carbide (SiC) Characterization Plug and Play module.
Device sockets are place for plug and play modules. GaN device characterization is used with a 4-pin Phoenix connector for flexibility. SiC device characterization is used with a commercially standard TO247 package. The testbed offers easy access to multiple measurement interfaces, such as on/off state voltage and current measurement.

Specifications

Gallium Nitrade (GaN) Characterization Plug and Play Module

Silicon Carbide (SiC) Characterization Plug and Play Module

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